Professor, Electrical and Computer Engineering
Director, Center for Magnetic Recording Research
Magnetic recording and nano-technologies; thin film and superlattice growth, interfacial and thin-film magnetism, x-ray and neutron scattering. Dr. Fullerton's expertise is in thin-film magnetic and nano-materials. He is an internationally acclaimed scholar in areas such as thin film and superlattice growth, magnetic recording and nano-technologies, and x-ray and neutron scattering. At IBM/Hitachi, Dr. Fullerton made fundamental advances in the development of high density magnetic recording media based on anti-ferromagnetically coupled ferromagnetic films. Early in his career, he developed a technique for mapping the structure of thin-film multi-layers from x-ray diffraction data that became the standard in the field.
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